Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10831095 | Critical dimension measurement system and method of measuring critical dimensions using same | Won Joo Park, Hyung Joo Lee, Dong-Seok Nam, Yoon Taek Han | 2020-11-10 |
SC
Seuk Hwan Choi
Overall (2020): #282,325 of 565,922Top 50%
1
Patents 2020