DN

Dong-Seok Nam

Samsung: 1 patents #7,050 of 16,666Top 45%
📍 Seoul, KR: #3,340 of 8,189 inventorsTop 45%
Overall (2020): #487,160 of 565,922Top 90%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10831095 Critical dimension measurement system and method of measuring critical dimensions using same Won Joo Park, Hyung Joo Lee, Seuk Hwan Choi, Yoon Taek Han 2020-11-10