Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10831095 | Critical dimension measurement system and method of measuring critical dimensions using same | Hyung Joo Lee, Seuk Hwan Choi, Dong-Seok Nam, Yoon Taek Han | 2020-11-10 |
| 10795932 | Method and apparatus for generating title and keyframe of video | Jeong Woo SON, Sun-Joong Kim, Sang-Yun Lee | 2020-10-06 |