Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10859925 | Method of and system for determining an overlay or alignment error between a first and a second device layer of a multilayer semiconductor device | Violeta Navarro Paredes, Hamed Sadeghian Marnani | 2020-12-08 |
| 10775405 | Method of and system for performing defect detection on or characterization of a layer of a semiconductor element or semi-manufactured semiconductor element | Hamed Sadeghian Marnani, Rutger Meijer Timmerman Thijssen | 2020-09-15 |
| 10746702 | Method of tuning parameter settings for performing acoustic scanning probe microscopy for subsurface imaging, scanning probe microscopy system, and computer program product | Hamed Sadeghian Marnani, Rutger Meijer Timmerman Thijssen | 2020-08-18 |