Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10775405 | Method of and system for performing defect detection on or characterization of a layer of a semiconductor element or semi-manufactured semiconductor element | Hamed Sadeghian Marnani, Maarten Hubertus van Es | 2020-09-15 |
| 10746702 | Method of tuning parameter settings for performing acoustic scanning probe microscopy for subsurface imaging, scanning probe microscopy system, and computer program product | Hamed Sadeghian Marnani, Maarten Hubertus van Es | 2020-08-18 |