Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10754260 | Method and system for process control with flexible sampling | Onur N. Demirer, Roie Volkovich, William Pierson, Dana Klein | 2020-08-25 |
| 10685165 | Metrology using overlay and yield critical patterns | Daniel Kandel, Mark D. Smith, Eran Amit, Myungjun Lee | 2020-06-16 |
| 10643286 | Knowledge management tool interface | Sandra J. Stevens, Belinda A. Lellock, Anthony Jason Ma'luf, Kurt E. Grashaw | 2020-05-05 |