Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10699969 | Quick adjustment of metrology measurement parameters according to process variation | Eran Amit, Alexander Svizher, Yuval Lamhot, Noga Sella, Wei-Te Cheng | 2020-06-30 |