Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10656534 | Method of measuring, device manufacturing method, metrology apparatus, and lithographic system | Nitesh Pandey, Jin LIAN, Martin Jacobus Johan Jak | 2020-05-19 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10656534 | Method of measuring, device manufacturing method, metrology apparatus, and lithographic system | Nitesh Pandey, Jin LIAN, Martin Jacobus Johan Jak | 2020-05-19 |