Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10833172 | Gate stack reliability in vertical transport field effect transistors | Choonghyun Lee, Christopher J. Waskiewicz, Hemanth Jagannathan | 2020-11-10 |
| 10651123 | High density antifuse co-integrated with vertical FET | Alexander Reznicek, Pouya Hashemi, Takashi Ando | 2020-05-12 |
| 10636874 | External resistance reduction with embedded bottom source/drain for vertical transport FET | Choonghyun Lee, Reinaldo Vega, Jingyun Zhang | 2020-04-28 |