Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10801953 | Semiconductor metrology based on hyperspectral imaging | David Y. Wang, Alexander Buettner, Stilian Ivanov Pandev, Andrei V. Shchegrov, Barry Blasenheim | 2020-10-13 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10801953 | Semiconductor metrology based on hyperspectral imaging | David Y. Wang, Alexander Buettner, Stilian Ivanov Pandev, Andrei V. Shchegrov, Barry Blasenheim | 2020-10-13 |