Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10770258 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Christopher Sears, Harsh Sinha, David Kaz, Wei Ye | 2020-09-08 |
| 10643819 | Method and system for charged particle microscopy with improved image beam stabilization and interrogation | Doug K. Masnaghetti, Gabor Toth, Rohit Bothra, Grace Hsiu-Ling Chen, Rainer Knippelmeyer | 2020-05-05 |