Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10770258 | Method and system for edge-of-wafer inspection and review | Christopher Sears, Harsh Sinha, David Trease, David Kaz, Wei Ye | 2020-09-08 |
| 10748739 | Deflection array apparatus for multi-electron beam system | Christopher Sears | 2020-08-18 |