Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10783625 | Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI | Minoru Harada, Fumihiko Fukunaga, Yuji Takagi | 2020-09-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10783625 | Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI | Minoru Harada, Fumihiko Fukunaga, Yuji Takagi | 2020-09-22 |