Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10832901 | EELS detection technique in an electron microscope | Bert Henning Freitag, Sorin Lazar, Stephan Kujawa, Gerard Nicolaas Anne van Veen, Peter Christiaan Tiemeijer +1 more | 2020-11-10 |
| 10651008 | Diffraction pattern detection in a transmission charged particle microscope | Bart Buijsse | 2020-05-12 |