BB

Bart Buijsse

FE Fei: 2 patents #6 of 98Top 7%
Overall (2020): #191,302 of 565,922Top 35%
2
Patents 2020

Issued Patents 2020

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
10651008 Diffraction pattern detection in a transmission charged particle microscope Maarten Kuijper 2020-05-12
10545100 X-ray imaging technique Faysal Boughorbel 2020-01-28