Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10811223 | Method of analyzing surface modification of a specimen in a charged-particle microscope | Pavel Potocek, Mathijs Petrus Wilhelmus van den Boogaard, Emine Korkmaz | 2020-10-20 |
| 10545100 | X-ray imaging technique | Bart Buijsse | 2020-01-28 |