EK

Emine Korkmaz

FE Fei: 1 patents #19 of 98Top 20%
Overall (2020): #481,241 of 565,922Top 90%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10811223 Method of analyzing surface modification of a specimen in a charged-particle microscope Pavel Potocek, Faysal Boughorbel, Mathijs Petrus Wilhelmus van den Boogaard 2020-10-20