Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10832901 | EELS detection technique in an electron microscope | Bert Henning Freitag, Sorin Lazar, Stephan Kujawa, Maarten Kuijper, Gerard Nicolaas Anne van Veen +1 more | 2020-11-10 |
| 10559448 | Transmission charged particle microscope with improved EELS/EFTEM module | Alexander Henstra | 2020-02-11 |