Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10832901 | EELS detection technique in an electron microscope | Bert Henning Freitag, Sorin Lazar, Stephan Kujawa, Maarten Kuijper, Peter Christiaan Tiemeijer +1 more | 2020-11-10 |
| 10651005 | Innovative source assembly for ion beam production | Leon van Kouwen | 2020-05-12 |
| 10607811 | Multi-beam scanning transmission charged particle microscope | Ali Mohammadi-Gheidari, Ivan Lazic, Eric Gerardus Theodoor Bosch | 2020-03-31 |