Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10620550 | Metrology method and apparatus | Martin Jacobus Johan Jak, Arie Jeffrey Den Boef, Nitesh Pandey | 2020-04-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10620550 | Metrology method and apparatus | Martin Jacobus Johan Jak, Arie Jeffrey Den Boef, Nitesh Pandey | 2020-04-14 |