Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10720367 | Process window analysis | Idan Kaizerman | 2020-07-21 |
| 10605745 | Guided inspection of a semiconductor wafer based on systematic defects | Boaz Cohen, Saar Shabtay, Eli Buchman | 2020-03-31 |