Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10605745 | Guided inspection of a semiconductor wafer based on systematic defects | Yotam Sofer, Boaz Cohen, Saar Shabtay | 2020-03-31 |
EB
Eli Buchman
Overall (2020): #482,648 of 565,922Top 90%
1
Patents 2020