Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10832092 | Method of generating a training set usable for examination of a semiconductor specimen and system thereof | Ohad Shaubi, Assaf Asbag | 2020-11-10 |
| 10605745 | Guided inspection of a semiconductor wafer based on systematic defects | Yotam Sofer, Saar Shabtay, Eli Buchman | 2020-03-31 |