Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10871451 | System, method and computer program product for object examination | Moshe Amzaleg, Zvi Goren | 2020-12-22 |
| 10818000 | Iterative defect filtering process | Idan Kaizerman, Amir Watchs | 2020-10-27 |
| 10605745 | Guided inspection of a semiconductor wafer based on systematic defects | Yotam Sofer, Boaz Cohen, Eli Buchman | 2020-03-31 |