| 10515990 |
Semiconductor devices having reduced noise |
Feng-Chi Hung, Shou-Gwo Wuu |
2019-12-24 |
| 10510789 |
Extra doped region for back-side deep trench isolation |
Chun-Yuan Chen, Ching-Chun Wang, Dun-Nian Yaung, Hsiao-Hui Tseng, Shyh-Fann Ting +4 more |
2019-12-17 |
| 10510797 |
Semiconductor image sensor |
Wei-Chieh Chiang, Keng-Yu Chou, Chun-Hao Chuang, Wen-Hau Wu, Chien-Hsien Tseng +1 more |
2019-12-17 |
| 10510795 |
Semiconductor image sensor |
Keng-Yu Chou, Chun-Hao Chuang, Chien-Hsien Tseng, Kazuaki Hashimoto, Wei-Chieh Chiang +3 more |
2019-12-17 |
| 10367023 |
Semiconductor image sensor |
Keng-Yu Chou, Chun-Hao Chuang, Chien-Hsien Tseng, Kazuaki Hashimoto, Wei-Chieh Chiang +3 more |
2019-07-30 |
| 10276618 |
Extra doped region for back-side deep trench isolation |
Chun-Yuan Chen, Ching-Chun Wang, Dun-Nian Yaung, Hsiao-Hui Tseng, Shyh-Fann Ting +4 more |
2019-04-30 |
| 10269858 |
Image sensor with reduced optical path |
Shyh-Fann Ting, Ching-Chun Wang, Chen-Jong Wang, Chun-Ming Su, Wei Chuang Wu +1 more |
2019-04-23 |
| 10269857 |
Image sensor comprising reflective guide layer and method of forming the same |
Wei Chuang Wu, Yu-Jen Wang, Yen-Chang Chu, Shyh-Fann Ting, Ching-Chun Wang |
2019-04-23 |
| 10177187 |
Implant damage free image sensor and method of the same |
Alexander Kalnitsky, Dun-Nian Yaung, Chen-Jong Wang, Yimin Huang, Yuichiro Yamashita |
2019-01-08 |
