Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10302414 | Scatterometry method and system | Gilad Wainreb, Etai Littwin, Alok Vaid, Michael Klots, Matthew Sendelbach | 2019-05-28 |
| 10209206 | Method and system for determining strain distribution in a sample | Gilad Barak, Shay Wolfling, Matthew Sendelbach | 2019-02-19 |
| 10197506 | Optical metrology for in-situ measurements | Igor Turovets, Dario Elyasi | 2019-02-05 |