Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10302414 | Scatterometry method and system | Gilad Wainreb, Etai Littwin, Alok Vaid, Michael Klots, Cornel Bozdog | 2019-05-28 |
| 10222710 | Method and system for planning metrology measurements | Niv Sarig, Charles N. Archie | 2019-03-05 |
| 10209206 | Method and system for determining strain distribution in a sample | Gilad Barak, Shay Wolfling, Cornel Bozdog | 2019-02-19 |