Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10508900 | Three-dimensional scatterometry for measuring dielectric thickness | Padraig Timoney | 2019-12-17 |
| 10302414 | Scatterometry method and system | Gilad Wainreb, Etai Littwin, Michael Klots, Cornel Bozdog, Matthew Sendelbach | 2019-05-28 |