Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10295329 | Monitoring system and method for verifying measurements in patterned structures | Boaz Brill, Boris Sherman | 2019-05-21 |
| 10226852 | Surface planarization system and method | — | 2019-03-12 |
| 10216098 | Test structure for use in metrology measurements of patterns | Oded Cohen, Gilad Barak | 2019-02-26 |
| 10197506 | Optical metrology for in-situ measurements | Cornel Bozdog, Dario Elyasi | 2019-02-05 |