Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10359369 | Metrology test structure design and measurement scheme for measuring in patterned structures | Gilad Barak | 2019-07-23 |
| D852656 | Wearable device | Ran Kazes | 2019-07-02 |
| 10216098 | Test structure for use in metrology measurements of patterns | Gilad Barak, Igor Turovets | 2019-02-26 |