Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10262830 | Scanning electron microscope and electron trajectory adjustment method therefor | Daisuke Bizen, Michio Hatano, Hiroya Ohta | 2019-04-16 |
| 10241062 | Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member | Yusuke Ominami, Mitsugu Sato, Kenko Uchida, Sadamitsu Aso, Taku Sakazume +2 more | 2019-03-26 |