Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10438771 | Measurement device, calibration method of measurement device, and calibration member | Yoshinori Nakayama, Masaru Matsuzaki, Hiroki Kawada, Yoshinori Momonoi, Zhigang Wang | 2019-10-08 |
| 10262830 | Scanning electron microscope and electron trajectory adjustment method therefor | Daisuke Bizen, Hideo Morishita, Hiroya Ohta | 2019-04-16 |