Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10438771 | Measurement device, calibration method of measurement device, and calibration member | Michio Hatano, Yoshinori Nakayama, Masaru Matsuzaki, Hiroki Kawada, Zhigang Wang | 2019-10-08 |
| 10340115 | Charged particle beam apparatus | Muneyuki Fukuda, Akihiro Miura, Fumihiro Sasajima, Hiroaki Mito | 2019-07-02 |
| 10217604 | Charged particle beam apparatus | Makoto Sakakibara, Hajime Kawano, Makoto Suzuki, Yuji Kasai, Daisuke Bizen | 2019-02-26 |
| 10186399 | Scanning electron microscope | Mayuka Osaki, Chie Shishido, Maki Tanaka, Hitoshi Namai, Fumihiro Sasajima +1 more | 2019-01-22 |