Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10338367 | Scanning microscope with controlled variable measurement parameters | Ryoko Araki, Hyejin Kim | 2019-07-02 |
| 10262830 | Scanning electron microscope and electron trajectory adjustment method therefor | Hideo Morishita, Michio Hatano, Hiroya Ohta | 2019-04-16 |
| 10217604 | Charged particle beam apparatus | Makoto Sakakibara, Hajime Kawano, Makoto Suzuki, Yuji Kasai, Yoshinori Momonoi | 2019-02-26 |