Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10241062 | Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member | Yusuke Ominami, Kenko Uchida, Sadamitsu Aso, Taku Sakazume, Hideo Morishita +2 more | 2019-03-26 |
| 10176968 | Method for adjusting charged particle beam device and adjusting beam aperture based on a selected emission condition and charged particle beam device for same | Kunji Shigeto, Tsutomu Saito, Kohtaro Hosoya, Yoshihiro Takahoko, Tohru Ando | 2019-01-08 |