Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10431416 | Observation support unit for charged particle microscope and sample observation method using same | Akiko Hisada | 2019-10-01 |
| 10241062 | Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member | Mitsugu Sato, Kenko Uchida, Sadamitsu Aso, Taku Sakazume, Hideo Morishita +2 more | 2019-03-26 |