JM

John Mitchels

FE Fei: 2 patents #4 of 103Top 4%
Overall (2019): #156,482 of 560,194Top 30%
2
Patents 2019

Issued Patents 2019

Patent #TitleCo-InventorsDate
10475629 Charged-particle microscope with in situ deposition functionality Rudolf Johannes Peter Gerardus Schampers, Michal Hrouzek, Tomas Gardelka 2019-11-12
10170275 Cryogenic specimen processing in a charged particle microscope Tomá{hacek over (s)} Vystav{hacek over (e)}l, Martin Cafourek 2019-01-01