Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10496781 | Metrology recipe generation using predicted metrology images | Chao Fang, Mark D. Smith | 2019-12-03 |
| 10416088 | Virtual inspection systems with multiple modes | Saibal Banerjee | 2019-09-17 |
| 10402461 | Virtual inspection systems for process window characterization | Laurent Karsenti, Kris Bhaskar, Mark Wagner, Vijayakumar Ramachandran | 2019-09-03 |
| 10359371 | Determining one or more characteristics of a pattern of interest on a specimen | Ashok Kulkarni, Michael Lennek, Allen Park | 2019-07-23 |
| 10276346 | Particle beam inspector with independently-controllable beams | Amir Azordegan, Christopher Sears | 2019-04-30 |
| 10267746 | Automated pattern fidelity measurement plan generation | Ajay Gupta, Thanh Huy Ha | 2019-04-23 |