| 10468491 |
Low resistance contact for transistors |
Lawrence A. Clevenger, Junli Wang, Baozhen Li, Terry A. Spooner, John E. Sheets, II |
2019-11-05 |
| 10460990 |
Semiconductor via structure with lower electrical resistance |
Lawrence A. Clevenger, Baozhen Li, Terry A. Spooner, Junli Wang |
2019-10-29 |
| 10460985 |
Enhancement of iso-via reliability |
Lawrence A. Clevenger, Baozhen Li, Xiao Hu Liu |
2019-10-29 |
| 10453987 |
Photodiode structures |
John J. Ellis-Monaghan, Jeffrey P. Gambino, Mark D. Jaffe |
2019-10-22 |
| 10424686 |
Photodiode structures |
John J. Ellis-Monaghan, Jeffrey P. Gambino, Mark D. Jaffe |
2019-09-24 |
| 10361265 |
Precision BEOL resistors |
Baozhen Li, John E. Sheets, II, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang |
2019-07-23 |
| 10340330 |
Precision BEOL resistors |
Baozhen Li, John E. Sheets, II, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang |
2019-07-02 |
| 10332956 |
Precision beol resistors |
Baozhen Li, John E. Sheets, II, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang |
2019-06-25 |
| 10332955 |
Precision BEOL resistors |
Baozhen Li, John E. Sheets, II, Lawrence A. Clevenger, Junli Wang, Chih-Chao Yang |
2019-06-25 |
| 10256145 |
Semiconductor device and method of forming the semiconductor device |
Lawrence A. Clevenger, Baozhen Li, John E. Sheets, II, Junli Wang, Chih-Chao Yang |
2019-04-09 |
| 10254340 |
Independently driving built-in self test circuitry over a range of operating conditions |
John Bradley Deforge, Terence B. Hook, Theresa A. Newton |
2019-04-09 |
| 10215804 |
Semiconductor power and performance optimization |
Sean Michael Carey, Andrew A. Turner |
2019-02-26 |
| 10191213 |
Shielding structures between optical waveguides |
John J. Ellis-Monaghan, Jeffrey P. Gambino, Mark D. Jaffe, Jed H. Rankin |
2019-01-29 |
