Issued Patents 2018
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10090166 | Techniques for forming isolation structures in a substrate | Andrew Waite, Johannes M. van Meer, Jae-Young Lee | 2018-10-02 |
| 10081861 | Selective processing of a workpiece | Daniel Distaso, Stanislav S. Todorov, Mark R. Amato, William Davis Lee, Jillian Reno | 2018-09-25 |
| D825912 | Crutches | — | 2018-08-21 |
| 10002764 | Sputter etch material selectivity | Kevin Anglin, Tristan Y. Ma, John Hautala, Heyun Yin | 2018-06-19 |
| 9960089 | Apparatus and method for endpoint detection | Ross Bandy | 2018-05-01 |
| 9933314 | Semiconductor workpiece temperature measurement system | Klaus Petry, Jason M. Schaller, Ala Moradian | 2018-04-03 |
| 9899242 | Device and method for substrate heating during transport | Jason M. Schaller, Ala Moradian, Robert Brent Vopat, David Blahnik, William T. Weaver | 2018-02-20 |