Issued Patents 2018
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157998 | Semiconductor device and manufacturing method thereof | Yu-Sheng Wang, Da-Yuan Lee, Hsin-Yi Lee, Kuan-Ting Liu | 2018-12-18 |
| 10157785 | Semiconductor device and method | Yu-Sheng Wang, Ching-Hwanq Su, Liang-Yueh Ou Yang, Ming-Hsing Tsai, Yu-Ting Lin | 2018-12-18 |
| 10147799 | Method of fabricating tantalum nitride barrier layer and semiconductor device thereof | Yu-Sheng Wang, Weng-Cheng Chen, Hao Wei, Ming-Ching CHUNG, Chi-Cherng Jeng | 2018-12-04 |
| 10146141 | Lithography process and system with enhanced overlay quality | Wei-Liang Lin, Yung-Sung Yen, Chun-Kuang Chen, Ru-Gun Liu, Tsai-Sheng Gau +6 more | 2018-12-04 |
| 10090206 | FinFET gate structure and method for fabricating the same | Shiu-Ko JangJian, Horng-Huei Tseng | 2018-10-02 |
| 10056265 | Directed self-assembly process with size-restricted guiding patterns | Ming-Huei Weng, Kuan-Hsin Lo, Wei-Liang Lin | 2018-08-21 |
| 10049918 | Directional patterning methods | Ru-Gun Liu, Wei-Liang Lin, Ta-Ching Yu, Yung-Sung Yen, Ziwei Fang +3 more | 2018-08-14 |
| 10032639 | Methods for improved critical dimension uniformity in a semiconductor device fabrication process | Chun-Kuang Chen, De-Fang Chen, Wei-Liang Lin, Yu-Tien Shen | 2018-07-24 |
| 9991362 | Semiconductor device including tungsten gate and manufacturing method thereof | Yu-Sheng Wang, Chia-Ching Lee, Chung-Chiang Wu | 2018-06-05 |
| 9991132 | Lithographic technique incorporating varied pattern materials | Chin-Yuan Tseng, Chun-Kuang Chen, De-Fang Chen, Ru-Gun Liu, Tsai-Sheng Gau +1 more | 2018-06-05 |
| 9991124 | Metal gate and manufacturing method thereof | Yu-Sheng Wang, Ting-Siang Su, Ching-Hwanq Su | 2018-06-05 |
| 9947753 | Semiconductor structure and manufacturing method thereof | Kei-Wei Chen, Yu-Sheng Wang, Ming-Ching CHUNG, Chia-Yang Wu | 2018-04-17 |
| 9870995 | Formation of copper layer structure with self anneal strain improvement | Jun-Nan Nian, Shiu-Ko JangJian, Yu-Sheng Wang, Hung-Hsu Chen | 2018-01-16 |