Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10120024 | Multi-stage test response compactors | Janusz Rajski, Grzegorz Mrugalski, Mark Kassab, Wu-Tung Cheng | 2018-11-06 |
| 10120029 | Low power testing based on dynamic grouping of scan | Janusz Rajski, Sylwester Milewski, Grzegorz Mrugalski | 2018-11-06 |
| 9933485 | Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives | Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki | 2018-04-03 |