Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9933485 | Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives | Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jerzy Tyszer | 2018-04-03 |