Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10120024 | Multi-stage test response compactors | Janusz Rajski, Jerzy Tyszer, Mark Kassab, Wu-Tung Cheng | 2018-11-06 |
| 10120029 | Low power testing based on dynamic grouping of scan | Janusz Rajski, Sylwester Milewski, Jerzy Tyszer | 2018-11-06 |
| 9933485 | Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives | Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer | 2018-04-03 |
| 9874606 | Selective per-cycle masking of scan chains for system level test | Janusz Rajski, Dariusz Czysz, Nilanjan Mukherjee | 2018-01-23 |