Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10120024 | Multi-stage test response compactors | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Mark Kassab | 2018-11-06 |
| 9977080 | Generating test sets for diagnosing scan chain failures | Ruifeng Guo, Yu Huang | 2018-05-22 |
| 9915702 | Channel sharing for testing circuits having non-identical cores | Yu Huang, Mark Kassab, Janusz Rajski, Jay Babak Jahangiri | 2018-03-13 |
| 9857421 | Dynamic design partitioning for diagnosis | Huaxing Tang, Yu Huang, Robert Brady Benware, Xiaoxin Fan | 2018-01-02 |