Issued Patents 2018
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9945792 | Generating an array of spots on inclined surfaces | — | 2018-04-17 |
| 9915622 | Wafer inspection | Anatoly Romanovsky, Ivan Maleev, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll +2 more | 2018-03-13 |
| 9891177 | TDI sensor in a darkfield system | Jijen Vazhaeparambil, Daniel Kavaldjiev, Anatoly Romanovsky, Ivan Maleev, Christian Wolters +5 more | 2018-02-13 |
| 9886764 | Image acquisition system, image acquisition method, and inspection system | Stanley Stokowski, Andrew V. Hill, Johan De Greeve, Maarten J. van der Burgt, Karel Van Gils | 2018-02-06 |
| 9874526 | Methods and apparatus for polarized wafer inspection | Sheng Liu | 2018-01-23 |