Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10114069 | Method for electrical testing of a 3-D chip stack | Martin Eckert, Otto A. Torreiter, Quintino L. Trianni | 2018-10-30 |
| 9921268 | Auto-alignment of backer plate for direct docking test boards | Eberhard Dengler, Gabriele Kuczera, Siegfried Tomaschko, Quintino L. Trianni | 2018-03-20 |
| 9891272 | Module testing utilizing wafer probe test equipment | Martin Eckert, Quintino L. Trianni, Christian Zoellin | 2018-02-13 |
| 9885748 | Module testing utilizing wafer probe test equipment | Martin Eckert, Quintino L. Trianni, Christian Zoellin | 2018-02-06 |