Issued Patents 2018
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10146144 | Adjustable load transmitter | Siegfried Tomaschko, Roland Dieterle | 2018-12-04 |
| 10114914 | Layout effect characterization for integrated circuits | Thomas Gentner, Jens Kuenzer, Antje Mueller, Thomas Strach, Otto A. Torreiter | 2018-10-30 |
| 10114069 | Method for electrical testing of a 3-D chip stack | Eckhard Kunigkeit, Otto A. Torreiter, Quintino L. Trianni | 2018-10-30 |
| 10082419 | Adjustable load transmitter | Siegfried Tomaschko, Roland Dieterle | 2018-09-25 |
| 10082526 | Probe card alignment | Roland Dieterle, Siegfried Tomaschko | 2018-09-25 |
| 10056346 | Chip attach frame | Otto A. Torreiter, Quintino L. Trianni | 2018-08-21 |
| 9977053 | Wafer probe alignment | Joerg G. Appinger, Eberhard Dengler, Roland Dieterle, Gabriele Kuczera, Siegfried Tomaschko +2 more | 2018-05-22 |
| 9927463 | Wafer probe alignment | Joerg G. Appinger, Eberhard Dengler, Roland Dieterle, Gabriele Kuczera, Siegfried Tomaschko +2 more | 2018-03-27 |
| 9904748 | Layout effect characterization for integrated circuits | Thomas Gentner, Jens Kuenzer, Antje Mueller, Thomas Strach, Otto A. Torreiter | 2018-02-27 |
| 9892789 | Content addressable memory with match hit quality indication | Alexander Fritsch | 2018-02-13 |
| 9891272 | Module testing utilizing wafer probe test equipment | Eckhard Kunigkeit, Quintino L. Trianni, Christian Zoellin | 2018-02-13 |
| 9885748 | Module testing utilizing wafer probe test equipment | Eckhard Kunigkeit, Quintino L. Trianni, Christian Zoellin | 2018-02-06 |