Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10006965 | Integrated circuit chip and a method for testing the same | Wilhelm Haller, Markus Kaltenbach, Ulrich Krauch, Nicolas Maeding | 2018-06-26 |
| 9891272 | Module testing utilizing wafer probe test equipment | Martin Eckert, Eckhard Kunigkeit, Quintino L. Trianni | 2018-02-13 |
| 9885748 | Module testing utilizing wafer probe test equipment | Martin Eckert, Eckhard Kunigkeit, Quintino L. Trianni | 2018-02-06 |