| 10134732 |
Reduction of negative bias temperature instability |
Takashi Ando |
2018-11-20 |
| 10103060 |
Test structures for dielectric reliability evaluations |
David G. Brochu, JR., Roger A. Dufresne, Baozhen Li, James H. Stathis, Ernest Y. Wu |
2018-10-16 |
| 10102090 |
Non-destructive analysis to determine use history of processor |
Keith A. Jenkins, Emily A. Ray, Raphael P. Robertazzi, Peilin Song, James H. Stathis +4 more |
2018-10-16 |
| 10043938 |
Reducing dark current in germanium photodiodes by electrical over-stress |
Jason S. Orcutt |
2018-08-07 |
| 10002810 |
On-chip combined hot carrier injection and bias temperature instability monitor |
Keith A. Jenkins |
2018-06-19 |
| 9952274 |
Measurement for transistor output characteristics with and without self heating |
Keith A. Jenkins |
2018-04-24 |
| 9941371 |
Selective thickening of pFET dielectric |
Takashi Ando, Hemanth Jagannathan |
2018-04-10 |
| 9906960 |
Touch movement activation for gaining access beyond a restricted access gateway |
Keith A. Jenkins |
2018-02-27 |
| 9863994 |
On-chip leakage measurement |
Chen-Yong Cher, Keith A. Jenkins |
2018-01-09 |
| 9866221 |
Test circuit to isolate HCI degradation |
Keith A. Jenkins |
2018-01-09 |
